MRID

MRID (Micro Raman Identify Dual)

MRID (Micro Raman Identification Dual Lasers)

MRID is a microscopic Raman system inbuilt with two lasers automatically switchable by software. This design is granted a Taiwan invention patent I709732 and the corresponding USA utility patent is also under examination. It solves the trouble of optimizing the optical path each time a different laser wavelength is used, and in turn provides a highly reliable optical system that users without optical backgrounds could also handle with ease.

A third laser module or more could be integrated into MRID system thanks to its horizontal interlace design for the optical path. With two of the lasers built in and fixed, the additional laser module(s) connected via optical fiber are swappable and configurable by the users, facilitating a wider range of applications.(customization)

• Dual-Wavelength Acquisition   

One click to automatically measure the spectra excited by different wavelengths is another PTT proprietary feature. The two spectra acquired automatically below show at 520 cm-1 as well as NIR range the silicon chip behaves differently under 785-nm and under 532-nm lasers. This feature could also acquire both Raman and Photoluminescence signals respectively and automatically from the same excitation source.

• High-Precision Laser Power Control

Laser power output could be directly controlled by software, at 1 mW/step for RGB Lasersystems, one of the major laser brands used in MRID. In addition, laser power could be reduced by a round continuously variable neutral density filter (O.D 2.0~0.04) that is also controlled by software with high precision.

ND control : User-input & frequentiy used transmission     

Laser control : User input,1mW/step

• Polarization Module (Optional)

Different alignment of optical axis with respect to the incident laser polarization can lead to different spectra for anisotropic samples, such as strained films or crystals. The polarization feature facilitates the observation of such properties by controlling both directions via software.

• Exposure Control for Scan/View Switch

When observing samples, the laser power is reduced to lower than 0.01% so as to keep the image from overexposure. Such switch between SCAN and VIEW modes is automatically completed by software, avoiding manual vibration from shifting the sample and ensuring precision of both the position and the focus.